Novel method and apparatus for profiling protein specimen using electronics is described. The method comprises: providing a metal layer; providing a protein specimen layer adjacent to metal layer to form Schottky junction; providing forward bias voltage to the Schottky junction; collecting current over voltage (I-V) profile of Schottky junction; and comparing current over voltage profile of the Schottky junction with database of current over voltage profile of known protein. I-V profile of various proteins can be collected to build a protein database. This database can be used to identify unknown protein specimen.