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Method and Apparatus for Profiling DNA Specimen

Potential Commercialised fa-solid fa-cart-arrow-down violet
Reg. ID : 16899
Comments

Huraian

Novel method and apparatus for profiling dna specimen using electronics is described. The method comprises: providing a metal layer; providing a dna specimen layer adjacent to metal layer to form schottky junction; providing forward bias voltage to the schottky junction and collecting current over voltage (i-v) profile of schottky junction. I-v profile of various dna can be collected to build a dna database. This database can be used to identify unknown dna specimen. An apparatus is provided to profile dna specimen comprising: metal layer; the dna specimen adjacent to metal layer to form schottky junction, a forward bias voltage provider rectifies the schottky junction and a monitor collects current over voltage profile of schottky junction.

Contact Person/Inventor

Name Email Contact Phone
Um Centre Of Innovation And Enterprise (Umcie) umcie@um.edu.my 013-2250151 / 03-79677351

Intellectual Property

Type of IP Registration ID
1 Patent Filed PI 2017001551
2 Trademark 2015008232
3 Copyright CRLY00002701

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